Skip to content

Concept – Structured Light🔗

This chapter describes the usage of structured light for surface inspection (deflectometry).

Concept of Structured Light🔗

The basic concept behind structured light is to use a structured illumination, i.e. an illumination showing well known patterns. The way those patterns appear in the scene after hitting surfaces helps to further analyze or reconstruct the surfaces (see 3D Reconstruction / Structured Light).

Deflectometry is the procedure of analyzing the reflections of known patterns from specular or semi-specular surfaces. In such a setup, every pattern image must be shown by the display or monitor. It is then reflected by the specular surface under test, and a camera image of the reflection is acquired. Deformations of the pattern in the camera image are caused by the form of the specular surface which implies that defects on the specular surface can be detected.

In the following, the steps that are required to use structured light are described briefly.

Further operators🔗

The structured light model offers various other operators that help access and update the various parameters of the model.

The operator write_structured_light_modelWriteStructuredLightModel enables writing the structured light model to a file. Please note that previously generated pattern images are not written in this file. A structured light model file can be read using read_structured_light_modelReadStructuredLightModel.

Furthermore, it is possible to serialize and deserialize the structured light model using serialize_structured_light_modelSerializeStructuredLightModel and deserialize_structured_light_modelDeserializeStructuredLightModel.

Further Information🔗

See also the “Solution Guide Basics” for further details.